This completely revised second edition presents an introduction to statistical pattern recognition. Pattern recognition in general covers a wide range of problems: it is applied to engineering problems, such as character readers and wave form analysis as well as to brain modeling in biology and psychology. Statistical decision and estimation, which are the main subjects of this book, are regarded as fundamental to the study of pattern recognition. This book is appropriate as a text for introductory courses in pattern recognition and as a reference book for workers in the field. Each chapter contains computer projects as well as exercises.
Ripley brings together two crucial ideas in pattern recognition: statistical methods and machine learning via neural networks. He brings unifying principles to the fore, and reviews the state of the subject. Ripley also includes many examples to illustrate real problems in pattern recognition and how to overcome them.
Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields, including the areas of engineering, statistics, computer science and the social sciences. The book has been updated to cover new methods and applications, and includes a wide range of techniques such as Bayesian methods, neural networks, support vector machines, feature selection and feature reduction techniques.Technical descriptions and motivations are provided, and the techniques are illustrated using real examples. Statistical Pattern Recognition, 3rd Edition: * Provides a self-contained introduction to statistical pattern recognition. * Includes new material presenting the analysis of complex networks. * Introduces readers to methods for Bayesian density estimation. * Presents descriptions of new applications in biometrics, security, finance and condition monitoring. * Provides descriptions and guidance for implementing techniques, which will be invaluable to software engineers and developers seeking to develop real applications * Describes mathematically the range of statistical pattern recognition techniques. * Presents a variety of exercises including more extensive computer projects. The in-depth technical descriptions make the book suitable for senior undergraduate and graduate students in statistics, computer science and engineering. Statistical Pattern Recognition is also an excellent reference source for technical professionals. Chapters have been arranged to facilitate implementation of the techniques by software engineers and developers in non-statistical engineering fields.
A self-contained and coherent account of probabilistic techniques, covering: distance measures, kernel rules, nearest neighbour rules, Vapnik-Chervonenkis theory, parametric classification, and feature extraction. Each chapter concludes with problems and exercises to further the readers understanding. Both research workers and graduate students will benefit from this wide-ranging and up-to-date account of a fast- moving field.
The first edition, published in 1973, has become a classic reference in the field. Now with the second edition, readers will find information on key new topics such as neural networks and statistical pattern recognition, the theory of machine learning, and the theory of invariances. Also included are worked examples, comparisons between different methods, extensive graphics, expanded exercises and computer project topics. An Instructor’s Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.
An accompanying manual to Theodoridis/Koutroumbas, Pattern Recognition, that includes Matlab code of the most common methods and algorithms in the book, together with a descriptive summary and solved examples, and including real-life data sets in imaging and audio recognition.
This is the first comprehensive treatment of feed-forward neural networks from the perspective of statistical pattern recognition. After introducing the basic concepts, the book examines techniques for modeling probability density functions and the properties and merits of the multi-layer perceptron and radial basis function network models. Also covered are various forms of error functions, principal algorithms for error function minimalization, learning and generalization in neural networks, and Bayesian techniques and their applications. Designed as a text, with over 100 exercises, this fully up-to-date work will benefit anyone involved in the fields of neural computation and pattern recognition.
This is the first textbook on pattern recognition to present the Bayesian viewpoint. The book presents approximate inference algorithms that permit fast approximate answers in situations where exact answers are not feasible. It uses graphical models to describe probability distributions when no other books apply graphical models to machine
learning. No previous knowledge of pattern recognition or machine learning concepts is assumed. Familiarity with multivariate calculus and basic linear algebra is required, and some experience in the use of probabilities would be helpful though not essential as the book includes a self-contained introduction to basic probability theory.
This book considers classical and current theory and practice, of supervised, unsupervised and semi-supervised pattern recognition, to build a complete background for professionals and students of engineering. The authors, leading experts in the field of pattern recognition, have provided an up-to-date, self-contained volume encapsulating this wide spectrum of information. The very latest methods are incorporated in this edition: semi-supervised learning, combining clustering algorithms, and relevance feedback.